Prof. Yukitoshi Otani
Professor at Utsunomiya Univ
SPIE Involvement:
| Membership & Communities Committee | Symposia Committee | Fellow status | Conference Program Committee | Conference Chair | Author | Editor | Student Chapter Advisor
Area of Expertise:
Optomechatoronics , polarimetry , optical measurement , polarization engineering , optical actuator and manipulator
Publications (101)

PROCEEDINGS ARTICLE | May 24, 2018
Proc. SPIE. 10678, Optical Micro- and Nanometrology VII
KEYWORDS: Solar energy, Sun, Modulation, Reflection, Reflectivity, Numerical analysis, Solar radiation

PROCEEDINGS ARTICLE | May 21, 2018
Proc. SPIE. 10688, Photonics for Solar Energy Systems VII
KEYWORDS: Energy efficiency, Solar energy, Reflection, Reflectivity, Absorption

PROCEEDINGS ARTICLE | April 24, 2018
Proc. SPIE. 10711, Biomedical Imaging and Sensing Conference
KEYWORDS: Glucose, Polarization, Scattering, Polarimetry, Photoelastic modulators

PROCEEDINGS ARTICLE | April 24, 2018
Proc. SPIE. 10711, Biomedical Imaging and Sensing Conference
KEYWORDS: Eye, Imaging systems, Speckle, Optical coherence tomography, Wavefront sensors, Wavefronts, Wavefront aberrations, Adaptive optics, Retinal scanning, Adaptive optics optical coherence tomography

PROCEEDINGS ARTICLE | September 19, 2017
Proc. SPIE. 10407, Polarization Science and Remote Sensing VIII
KEYWORDS: Beam splitters, Polarization, Polarizers, Wave plates, Polarimetry, PIN photodiodes, Polarization analysis

PROCEEDINGS ARTICLE | August 30, 2017
Proc. SPIE. 10407, Polarization Science and Remote Sensing VIII
KEYWORDS: Photoelasticity, Statistical analysis, Modulation, Polarization, Phase shift keying, Polarizers, Wave plates, Polarimetry, Photoelastic modulators, Fused quartz

Showing 5 of 101 publications
Conference Committee Involvement (34)
Optical Metrology and Inspection for Industrial Applications V
11 October 2018 | Beijing, China
Interferometry XIX
21 August 2018 | San Diego, California, United States
Optical Micro- and Nanometrology
25 April 2018 | Strasbourg, France
Biomedical Imaging and Sensing Conference
25 April 2018 | Yokohama, Japan
Optical Measurement Systems for Industrial Inspection X
26 June 2017 | Munich, Germany
Showing 5 of 34 published special sections
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