Prof. Yukitoshi Otani
Professor at Utsunomiya Univ
SPIE Involvement:
| Membership & Communities Committee | Symposia Committee | Fellow status | Conference Program Committee | Conference Chair | Author | Student Chapter Advisor
Area of Expertise:
Optomechatoronics , polarimetry , optical measurement , polarization engineering , optical actuator and manipulator
Publications (103)

PROCEEDINGS ARTICLE | August 18, 2018
Proc. SPIE. 10749, Interferometry XIX
KEYWORDS: Semiconductors, Confocal microscopy, Optical components, Edge detection, Image processing, Reliability, Image acquisition, Image analysis, Photomasks, Integrated circuits

PROCEEDINGS ARTICLE | August 18, 2018
Proc. SPIE. 10749, Interferometry XIX
KEYWORDS: Polarization, Speckle, Interferometers, Cameras, Sensors, Interferometry, Phase shift keying, Linear filtering, Demodulation, CCD image sensors

PROCEEDINGS ARTICLE | May 24, 2018
Proc. SPIE. 10678, Optical Micro- and Nanometrology VII
KEYWORDS: Solar energy, Sun, Modulation, Reflection, Reflectivity, Numerical analysis, Solar radiation

PROCEEDINGS ARTICLE | May 21, 2018
Proc. SPIE. 10688, Photonics for Solar Energy Systems VII
KEYWORDS: Energy efficiency, Solar energy, Reflection, Reflectivity, Absorption

PROCEEDINGS ARTICLE | April 24, 2018
Proc. SPIE. 10711, Biomedical Imaging and Sensing Conference
KEYWORDS: Eye, Imaging systems, Speckle, Optical coherence tomography, Wavefront sensors, Wavefronts, Wavefront aberrations, Adaptive optics, Retinal scanning, Adaptive optics optical coherence tomography

PROCEEDINGS ARTICLE | April 24, 2018
Proc. SPIE. 10711, Biomedical Imaging and Sensing Conference
KEYWORDS: Glucose, Polarization, Scattering, Polarimetry, Photoelastic modulators

Showing 5 of 103 publications
Conference Committee Involvement (37)
Optical Measurement Systems for Industrial Inspection XI
24 June 2019 | Munich, Germany
Optical Technology and Measurement for Industrial Applications Conference
24 April 2019 | Yokohama, Japan
Biomedical Imaging and Sensing Conference
24 April 2019 | Yokohama, Japan
Optical Metrology and Inspection for Industrial Applications V
11 October 2018 | Beijing, China
Interferometry XIX
21 August 2018 | San Diego, California, United States
Showing 5 of 37 published special sections
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