Dr. Yumi Mori
at IBM Japan Ltd
SPIE Involvement:
Conference Program Committee | Author
Publications (6)

PROCEEDINGS ARTICLE | August 19, 2005
Proc. SPIE. 5880, Optical Diagnostics
KEYWORDS: Visual analytics, Visualization, Wavelets, Denoising, Semiconductor materials, Inspection, Optical inspection, LCDs, Solids, Image enhancement

SPIE Journal Paper | November 1, 2004
OE Vol. 43 Issue 11
KEYWORDS: LCDs, Inspection, Visualization, Algorithm development, CCD cameras, Optical inspection, Sensors, Manufacturing, Computing systems, Visual analytics

PROCEEDINGS ARTICLE | November 27, 2002
Proc. SPIE. 4789, Algorithms and Systems for Optical Information Processing VI
KEYWORDS: Visual analytics, Visualization, Imaging systems, Sensors, Manufacturing, Inspection, Optical inspection, LCDs, Analytical research, Algorithm development

PROCEEDINGS ARTICLE | October 18, 2002
Proc. SPIE. 4902, Optomechatronic Systems III
KEYWORDS: Edge detection, Digital image processing, Visualization, Imaging systems, Sensors, Image processing, Inspection, CCD cameras, LCDs, Analytical research

PROCEEDINGS ARTICLE | November 13, 2001
Proc. SPIE. 4471, Algorithms and Systems for Optical Information Processing V
KEYWORDS: Visual analytics, Visualization, Glasses, Image processing, Manufacturing, Inspection, Optical inspection, Image quality, LCDs, Algorithm development

PROCEEDINGS ARTICLE | November 2, 2000
Proc. SPIE. 4113, Algorithms and Systems for Optical Information Processing IV
KEYWORDS: Optical filters, Visual analytics, Visualization, Sensors, Glasses, Manufacturing, Inspection, Computing systems, CCD cameras, LCDs

Showing 5 of 6 publications
Conference Committee Involvement (1)
Optical Metrology and Inspection for Industrial Applications
18 October 2010 | Beijing, China
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