Dr. Yumi Mori Profile

Dr. Yumi Mori

at IBM Japan Ltd

SPIE Involvement:

Author

Publications (6)

Proceedings Article | 19 August 2005 Paper

Measurement method for low-contrast nonuniformity in liquid crystal displays by using multi-wavelet analysis

Hiroki Nakano, Yumi Mori

Proceedings Volume 5880, 588013 (2005) https://doi.org/10.1117/12.616232

KEYWORDS: LCDs, Wavelets, Visualization, Solids, Visual analytics, Inspection, Denoising, Image enhancement, Optical inspection, Semiconductor materials

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SPIE Journal Paper | 1 November 2004

Quantitative evaluation of "mura" in liquid crystal displays

Yumi Mori, Kosei Tanahashi, Satoshi Tsuji

OE, Vol. 43, Issue 11, (November 2004) https://doi.org/10.1117/12.10.1117/1.1768942

KEYWORDS: LCDs, Inspection, Visualization, Algorithm development, CCD cameras, Optical inspection, Sensors, Manufacturing, Computing systems, Visual analytics

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Proceedings Article | 27 November 2002 Paper

Quantitative evaluation of luminance nonuniformity in liquid crystal displays based on sensory analysis

Yumi Mori, Ryoji Yoshitake, Tohru Tamura, Kiyo Moriguchi, Kosei Tanahashi, Satoshi Tsuji

Proceedings Volume 4789, (2002) https://doi.org/10.1117/12.453846

KEYWORDS: LCDs, Inspection, Sensors, Visualization, Visual analytics, Optical inspection, Analytical research, Manufacturing, Algorithm development, Imaging systems

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Proceedings Article | 18 October 2002 Paper

Evaluation and discrimination method of mura in liquid crystal displays by just-noticeable-difference observation

Yumi Mori, Ryoji Yoshitake, Tohru Tamura, Toru Yoshizawa, Satoshi Tsuji

Proceedings Volume 4902, (2002) https://doi.org/10.1117/12.467711

KEYWORDS: LCDs, Sensors, Image processing, Inspection, Imaging systems, CCD cameras, Edge detection, Digital image processing, Analytical research, Visualization

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Proceedings Article | 13 November 2001 Paper

Extraction and evaluation of mura in liquid crystal displays

Yumi Mori, Kohsei Tanahashi, Ryoji Yoshitake, Satoshi Tsuji

Proceedings Volume 4471, (2001) https://doi.org/10.1117/12.449348

KEYWORDS: LCDs, Visualization, Visual analytics, Inspection, Optical inspection, Image processing, Manufacturing, Glasses, Image quality, Algorithm development

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