Yunhui Wang
at Univ of Shanghai for Science and Technology
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | November 25, 2009
Proc. SPIE. 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology
KEYWORDS: Edge detection, Detection and tracking algorithms, Sensors, Image processing, Pattern recognition, Iris recognition, Feature extraction, Image filtering, Image enhancement, Ear

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