Yunus E. Akbas
at Univ of Rochester
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 15 May 2017 Presentation + Paper
Y. Akbas, T. Plecenik, P. Ďurina, A. Plecenik, A. Jukna, G. Wicks, Roman Sobolewski
Proceedings Volume 10229, 102290N (2017) https://doi.org/10.1117/12.2270908
KEYWORDS: Temperature metrology, Surface plasmons, Gallium arsenide, Electron beam lithography, Transient nonlinear optics, Diodes, Semiconductors, Nanostructures, Photodetectors, Optical semiconductors, Photonic nanostructures, Electron transport, Optical properties, Optical fabrication equipment, Heterojunctions

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