Prof. Yunxia Fu
at Shanghai Institute of Measurement and Testing Technology
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 18 November 2019
Proc. SPIE. 11189, Optical Metrology and Inspection for Industrial Applications VI
KEYWORDS: Metrology, Genetic algorithms, 3D acquisition, 3D imaging standards, Aerospace engineering, Calibration, Laser applications, Measurement devices, Optimization (mathematics), Environmental sensing

Proceedings Article | 12 January 2018
Proc. SPIE. 10621, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
KEYWORDS: Mathematical modeling, Metrology, Genetic algorithms, Computer programming, Distributed computing, Computer networks, Laser metrology, Optimization (mathematics), Network architectures, Laser systems engineering

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