Prof. Yunxia Fu
at Shanghai Institute of Measurement and Testing Technology
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 23 October 2020 Presentation + Paper
Proc. SPIE. 11552, Optical Metrology and Inspection for Industrial Applications VII
KEYWORDS: 3D scanning, Laser scanners, 3D imaging standards, Optical spheres, 3D modeling, Standards development, Calibration, Photogrammetry, Ultrasonography, Infrared radiation

Proceedings Article | 18 November 2019 Paper
Proc. SPIE. 11189, Optical Metrology and Inspection for Industrial Applications VI
KEYWORDS: Calibration, Optimization (mathematics), Measurement devices, Laser applications, Aerospace engineering, Genetic algorithms, Environmental sensing, Metrology, 3D imaging standards, 3D acquisition

Proceedings Article | 12 January 2018 Paper
Proc. SPIE. 10621, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
KEYWORDS: Distributed computing, Metrology, Computer programming, Optimization (mathematics), Genetic algorithms, Network architectures, Mathematical modeling, Laser metrology, Computer networks, Laser systems engineering

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