Prof. Yun Du
at Institute of Geodesy and Geophysics
SPIE Involvement:
Author
Publications (1)

SPIE Journal Paper | September 12, 2012
JRS Vol. 6 Issue 01
KEYWORDS: Remote sensing, Satellites, MODIS, In situ metrology, Satellite imaging, Error analysis, Spatial resolution, Calibration, In situ remote sensing, Earth observing sensors

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