Dr. Yuran Liu
at Institute of Optics and Electronics CAS
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 20 May 2009
Proc. SPIE. 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
KEYWORDS: Eye, Image processing, Retina, Image resolution, Adaptive optics, Image registration, Image quality, Corner detection, Mahalanobis distance, Mendelevium

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