Prof. Yuri V. Chugui
Director at Technological Design Institute of SIE
SPIE Involvement:
Senior status | Conference Program Committee | Conference Chair | Author
Publications (24)

Proceedings Article | 27 May 2011
Proc. SPIE. 8082, Optical Measurement Systems for Industrial Inspection VII
KEYWORDS: Diffraction, Safety, Diffractive optical elements, Inspection, 3D modeling, Far-field diffraction, 3D metrology, Spherical lenses, 3D image processing, Structured light

Proceedings Article | 12 January 2009
Proc. SPIE. 7133, Fifth International Symposium on Instrumentation Science and Technology

Proceedings Article | 12 January 2009
Proc. SPIE. 7133, Fifth International Symposium on Instrumentation Science and Technology

Proceedings Article | 22 April 2008
Proc. SPIE. 7008, Eighth International Conference on Correlation Optics
KEYWORDS: Safety, Diffractive optical elements, Interferometers, Cameras, Image processing, Laser applications, Inspection, 3D metrology, Profilometers, Prototyping

Proceedings Article | 25 October 2006
Proc. SPIE. 6280, Third International Symposium on Precision Mechanical Measurements
KEYWORDS: Safety, Sensors, Complex systems, Laser processing, Laser applications, Laser development, Inspection, Laser cutting, Position sensors, Laser systems engineering

Showing 5 of 24 publications
Conference Committee Involvement (11)
Optical Measurement Systems for Industrial Inspection X
26 June 2017 | Munich, Germany
Optical Measurement Systems for Industrial Inspection IX
22 June 2015 | Munich, Germany
Optical Measurement Systems for Industrial Inspection VIII
13 May 2013 | Munich, Germany
Optical Measurement Systems for Industrial Inspection
23 May 2011 | Munich, Germany
Optical Measurement Systems for Industrial Inspection
16 June 2009 | Munich, Germany
Showing 5 of 11 published special sections
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