Yuri A. Lemeshko
at TDI SIE
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 12 January 2009
Proc. SPIE. 7133, Fifth International Symposium on Instrumentation Science and Technology

Proceedings Article | 12 January 2009
Proc. SPIE. 7133, Fifth International Symposium on Instrumentation Science and Technology

Proceedings Article | 22 April 2008
Proc. SPIE. 7008, Eighth International Conference on Correlation Optics
KEYWORDS: Safety, Diffractive optical elements, Interferometers, Cameras, Image processing, Laser applications, Inspection, 3D metrology, Profilometers, Prototyping

Proceedings Article | 29 July 2002
Proc. SPIE. 4900, Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life
KEYWORDS: Diffraction, Mirrors, Reflection, Scattering, Metals, Error analysis, Inspection, Optical inspection, Geometrical optics, Instrumentation engineering

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