Dr. Yusuke Kajihara
at Institute of Industrial Science The Univ of Tokyo
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | May 14, 2018
Proc. SPIE. 10656, Image Sensing Technologies: Materials, Devices, Systems, and Applications V
KEYWORDS: Microscopes, Microscopy, Near field scanning optical microscopy, Near field, Infrared radiation, Spatial resolution, Signal detection

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