Yuwei Chen
at Shanghai Institute of Technical Physics CAS
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | February 10, 2005
Proc. SPIE. 5638, Optical Design and Testing II
KEYWORDS: Hyperspectral imaging, Chromatic aberrations, Imaging systems, Cameras, Sensors, Spectroscopy, Detector arrays, Spectral resolution, Charge-coupled devices, CCD image sensors

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top