Yuxuan Ma
at National Institute of Metrology
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 12 March 2020
Proc. SPIE. 11438, 2019 International Conference on Optical Instruments and Technology: Optoelectronic Imaging/Spectroscopy and Signal Processing Technology
KEYWORDS: Optical spheres, Black bodies, Integrating spheres, Photometry

Proceedings Article | 12 March 2020
Proc. SPIE. 11434, 2019 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments
KEYWORDS: Gold, Mid-IR, Metrology, Diffuse reflectance spectroscopy, Aerospace engineering, Remote sensing, Reflectivity, Black bodies, Light sources and illumination, Integrating spheres

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