Yves A. Gilliand
Manager Sales / Key Accounts at MIKROP AG
SPIE Involvement:
Conference Program Committee | Author
Websites:
Publications (2)

PROCEEDINGS ARTICLE | November 28, 2007
Proc. SPIE. 6834, Optical Design and Testing III
KEYWORDS: Photovoltaics, Metrology, Cameras, Sensors, Error analysis, Inspection, Wavefront sensors, Wavefronts, Spherical lenses, Optics manufacturing

SPIE Journal Paper | August 1, 1999
OE Vol. 38 Issue 08
KEYWORDS: Phase shifts, Nanoimprint lithography, Optical testing, Monochromatic aberrations, Wavefronts, Fizeau interferometers, Semiconductor lasers, Sensors, Beam splitters, Foam

Conference Committee Involvement (1)
Optical Design and Testing III
12 November 2007 | Beijing, China
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