Yves Surrel
Directeur R&D at TechLab
SPIE Involvement:
Conference Program Committee | Author
Publications (14)

PROCEEDINGS ARTICLE | September 15, 2006
Proc. SPIE. 6341, Speckle06: Speckles, From Grains to Flowers
KEYWORDS: Optical components, Mirrors, Optical spheres, Cameras, Calibration, Laser welding, Control systems, Spatial resolution, Phase measurement, Chemical elements

PROCEEDINGS ARTICLE | August 2, 2004
Proc. SPIE. 5531, Interferometry XII: Techniques and Analysis
KEYWORDS: Mirrors, Fabry–Perot interferometers, Detection and tracking algorithms, Interferometers, Cameras, Sensors, Interferometry, Thermal effects, Phase measurement, CCD image sensors

PROCEEDINGS ARTICLE | June 20, 2002
Proc. SPIE. 4777, Interferometry XI: Techniques and Analysis
KEYWORDS: Signal to noise ratio, Metrology, Speckle, Sensors, Interferometry, Phase shift keying, Gaussian filters, Measurement devices, Spatial resolution, Phase measurement

PROCEEDINGS ARTICLE | June 19, 2002
Proc. SPIE. 4778, Interferometry XI: Applications
KEYWORDS: Gold, Carbon, Speckle, Composites, Interferometry, Finite element methods, Fiber reinforced polymers, Spatial resolution, Shearography, Diffraction gratings

PROCEEDINGS ARTICLE | August 13, 1999
Proc. SPIE. 3744, Interferometry '99: Techniques and Technologies

PROCEEDINGS ARTICLE | September 29, 1998
Proc. SPIE. 3407, International Conference on Applied Optical Metrology
KEYWORDS: Signal to noise ratio, Fringe analysis, Metrology, Detection and tracking algorithms, Error analysis, Phase shift keying, Optical testing, Phase measurement, Phase shifts, Algorithms

Showing 5 of 14 publications
Conference Committee Involvement (1)
Interferometry XII: Techniques and Analysis
2 August 2004 | Denver, Colorado, United States
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top