Zahra Hosseinimakarem
Optical Metrology Engineer
SPIE Involvement:
Area of Expertise:
Metrology , Photolithography , Surface characterization , Zernike polynomials , Diffractive optics
Publications (6)

Proceedings Article | 23 August 2017
Proc. SPIE. 10373, Applied Optical Metrology II
KEYWORDS: Wavefronts, Zernike polynomials, Modulation transfer functions, Freeform optics, Optical components, Optical design, Scattering

Proceedings Article | 26 September 2016
Proc. SPIE. 9961, Reflection, Scattering, and Diffraction from Surfaces V
KEYWORDS: Zernike polynomials, Fabrication, Freeform optics, Received signal strength, Raster graphics, Optical spheres, Germanium, Polishing, Spatial frequencies, Superposition

Proceedings Article | 18 August 2014
Proc. SPIE. 9203, Interferometry XVII: Techniques and Analysis
KEYWORDS: Reconstruction algorithms, Spatial frequencies, Surface finishing, Metrology, Freeform optics, Wavefronts, Error analysis, Polishing, Image quality, Adaptive optics

SPIE Journal Paper | 22 November 2012
JM3 Vol. 11 Issue 4
KEYWORDS: Surface roughness, Photoresist materials, Spiral phase plates, Lithography, Additive manufacturing, Optical components, Photoresist developing, Optical vortices, Photoresist processing, Ultraviolet radiation

Proceedings Article | 15 February 2012
Proc. SPIE. 8249, Advanced Fabrication Technologies for Micro/Nano Optics and Photonics V
KEYWORDS: Surface roughness, Spiral phase plates, Photoresist materials, Additive manufacturing, Lithography, Photoresist developing, Radium, Optical vortices, Optical components, Picture Archiving and Communication System

Showing 5 of 6 publications
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