Prof. Zejun J. Ding
at Univ of Science and Technology of China
SPIE Involvement:
Author
Publications (6)

PROCEEDINGS ARTICLE | May 29, 2013
Proc. SPIE. 8729, Scanning Microscopies 2013: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences
KEYWORDS: Thin films, Refractive index, Lithium, Optical properties, Reflection, Copper, Dielectrics, Electrons, Solids, Algorithms

PROCEEDINGS ARTICLE | May 29, 2013
Proc. SPIE. 8729, Scanning Microscopies 2013: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences
KEYWORDS: Gold, Scattering, Image processing, X-rays, Silicon, Silver, Scanning electron microscopy, Monte Carlo methods, Image enhancement, X-ray imaging

PROCEEDINGS ARTICLE | May 29, 2013
Proc. SPIE. 8729, Scanning Microscopies 2013: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences
KEYWORDS: Monochromatic aberrations, Scattering, Image processing, Particles, Fourier transforms, Scanning electron microscopy, Monte Carlo methods, Statistical modeling, Device simulation, Instrument modeling

PROCEEDINGS ARTICLE | May 29, 2013
Proc. SPIE. 8729, Scanning Microscopies 2013: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences
KEYWORDS: Electron beams, Scattering, Image processing, Silicon, Scanning electron microscopy, Monte Carlo methods, Solids, Optical simulations, Beam shaping, Line scan image sensors

SPIE Journal Paper | July 1, 2009
JM3 Vol. 8 Issue 03
KEYWORDS: Monte Carlo methods, Scattering, Scanning electron microscopy, Silicon, Data modeling, Copper, Electron microscopes, Dielectrics, Model-based design, Binary data

PROCEEDINGS ARTICLE | March 23, 2009
Proc. SPIE. 7272, Metrology, Inspection, and Process Control for Microlithography XXIII
KEYWORDS: Data modeling, Scattering, Copper, Dielectrics, Silicon, Physics, Scanning electron microscopy, Monte Carlo methods, Binary data, Model-based design

Showing 5 of 6 publications
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