Dr. Zengwen Xiao
at Harbin Institute of Technology
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | February 9, 2005
Proc. SPIE. 5635, Nanophotonics, Nanostructure, and Nanometrology
KEYWORDS: Semiconductors, Metrology, Photography, Electron microscopes, Atomic force microscopy, Scanning electron microscopy, Precision measurement, Atomic force microscope, Mathematical morphology, Carbon nanotubes

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