Ze’nan Wu
at Zhoushan Institute of Calibration and Testing
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 12 March 2021 Paper
Xianlei Chen, Ze’nan Wu, Haolei Shi, Huadong Hao, Junxue Chen, Zhenqian Shen
Proceedings Volume 11763, 1176372 (2021) https://doi.org/10.1117/12.2587411

Proceedings Article | 12 March 2021 Paper
Ze’nan Wu, Xianlei Chen, Huadong Hao, Haolei Shi, Junxue Chen, Zhenqian Shen, Guohong Li, Huizhong Xu
Proceedings Volume 11763, 1176329 (2021) https://doi.org/10.1117/12.2586338

Proceedings Article | 12 March 2020 Paper
Huadong Hao, Cunjun Li, Xianlei Chen, Haolei Shi, Ze'nan Wu, Guohong Li, Huizhong Xu, Yingying Wang
Proceedings Volume 11439, 114391R (2020) https://doi.org/10.1117/12.2555158
KEYWORDS: Temperature metrology, 3D scanning, Optoelectronics, 3D modeling, Metrology, Data processing, Laser scanners

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