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Zhang Dayu
at China Academy of Space Technology
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Publications (1)
Proceedings Article | 8 February 2019 Paper
A test method of CMOS image sensors in dark field based on the genetic algorithm
Proceedings Volume 10843, 108431S (2019) https://doi.org/10.1117/12.2512317
KEYWORDS: Image sensors, Genetic algorithms, CMOS sensors, Image processing, Standards development, Light sources, Telecommunications, Integrating spheres, Sensors, Data acquisition
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