Zhangnan Zhu
at ASML
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 25 September 2010 Paper
Min-Chun Tsai, Shigeki Nojima, Masahiro Miyairi, Tatsuo Nishibe, Been-Der Chen, Hanying Feng, William Wong, Zhangnan Zhu, Yen-Wen Lu
Proceedings Volume 7823, 78233Q (2010) https://doi.org/10.1117/12.866139
KEYWORDS: SRAF, Optical proximity correction, Photomasks, Model-based design, Lithography, Mask making, Solids, Control systems, Logic, Statistical modeling

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top