Prof. Zhanshan Wang
Head of Institute at Tongji Univ
SPIE Involvement:
Fellow status | Conference Program Committee | Conference Chair | Author | Editor
Publications (95)

PROCEEDINGS ARTICLE | September 7, 2017
Proc. SPIE. 10385, Advances in Metrology for X-Ray and EUV Optics VII
KEYWORDS: Mirrors, X-rays, Stitching interferometry, Synchrotrons, Interferometry, Spherical lenses, Fizeau interferometers, Interferometers, Optical components, Nano opto mechanical systems

PROCEEDINGS ARTICLE | September 6, 2017
Proc. SPIE. 10356, Nanostructured Thin Films X
KEYWORDS: Sol-gels, Ion beams, Etching, Coating, Antireflective coatings, Nanostructures, Forward error correction, Thin film manufacturing

PROCEEDINGS ARTICLE | August 29, 2017
Proc. SPIE. 10399, Optics for EUV, X-Ray, and Gamma-Ray Astronomy VIII
KEYWORDS: Stray light, Space telescopes, Optical design, Magnetism, Device simulation, Telescopes, Geometrical optics

PROCEEDINGS ARTICLE | August 29, 2017
Proc. SPIE. 10399, Optics for EUV, X-Ray, and Gamma-Ray Astronomy VIII
KEYWORDS: X-ray telescopes, Optical design, Optical simulations, Spatial resolution, X-rays, Telescopes

PROCEEDINGS ARTICLE | August 16, 2017
Proc. SPIE. 10452, 14th Conference on Education and Training in Optics and Photonics: ETOP 2017
KEYWORDS: Polarizers, Raman spectroscopy, Transmittance, Polarization, Spectroscopy

PROCEEDINGS ARTICLE | May 31, 2017
Proc. SPIE. 10235, EUV and X-ray Optics: Synergy between Laboratory and Space V
KEYWORDS: Mirrors, X-ray telescopes, X-rays, Reflectivity, Sputter deposition, Annealing, Polarization, Particle accelerators, Reflector telescopes, Telescopes, Multilayers, Protactinium, Interfaces, Argon

Showing 5 of 95 publications
Conference Committee Involvement (9)
Advances in X-Ray/EUV Optics and Components XIII
19 August 2018 | San Diego, California, United States
Advances in X-Ray/EUV Optics and Components XII
8 August 2017 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics VII
6 August 2017 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics VI
29 August 2016 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics V
18 August 2014 | San Diego, California, United States
Showing 5 of 9 published special sections
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