Prof. Zhanshan Wang
Head of Institute at Tongji Univ
SPIE Involvement:
Fellow status | Conference Program Committee | Conference Chair | Author | Editor
Publications (97)

PROCEEDINGS ARTICLE | November 23, 2017
Proc. SPIE. 10447, Laser-Induced Damage in Optical Materials 2017
KEYWORDS: Refractive index, Scattering, Annealing, Optical coatings, Laser scattering, Doping, Absorption

PROCEEDINGS ARTICLE | November 13, 2017
Proc. SPIE. 10447, Laser-Induced Damage in Optical Materials 2017
KEYWORDS: Thin films, Reflection, Laser induced damage, Interfaces, Coating, Nd:YAG lasers, Laser amplifiers

PROCEEDINGS ARTICLE | September 7, 2017
Proc. SPIE. 10385, Advances in Metrology for X-Ray and EUV Optics VII
KEYWORDS: Optical components, Mirrors, Nano opto mechanical systems, Interferometers, X-rays, Interferometry, Synchrotrons, Spherical lenses, Stitching interferometry, Fizeau interferometers

PROCEEDINGS ARTICLE | September 6, 2017
Proc. SPIE. 10356, Nanostructured Thin Films X
KEYWORDS: Nanostructures, Antireflective coatings, Etching, Coating, Ion beams, Sol-gels, Forward error correction, Thin film manufacturing

PROCEEDINGS ARTICLE | August 29, 2017
Proc. SPIE. 10399, Optics for EUV, X-Ray, and Gamma-Ray Astronomy VIII
KEYWORDS: Telescopes, Optical design, X-rays, Optical simulations, Spatial resolution, X-ray telescopes

PROCEEDINGS ARTICLE | August 29, 2017
Proc. SPIE. 10399, Optics for EUV, X-Ray, and Gamma-Ray Astronomy VIII
KEYWORDS: Telescopes, Optical design, Magnetism, Space telescopes, Geometrical optics, Stray light, Device simulation

Showing 5 of 97 publications
Conference Committee Involvement (9)
Advances in X-Ray/EUV Optics and Components XIII
19 August 2018 | San Diego, California, United States
Advances in X-Ray/EUV Optics and Components XII
8 August 2017 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics VII
6 August 2017 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics VI
29 August 2016 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics V
18 August 2014 | San Diego, California, United States
Showing 5 of 9 published special sections
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