Zhao-Feng Bai
at Xi'an Technological Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 18 September 2014 Paper
Proceedings Volume 9282, 92821H (2014) https://doi.org/10.1117/12.2068680
KEYWORDS: Interferometers, Diffraction gratings, Optical testing, Semiconductor lasers, Sensors, Interferometry, Photomasks, Light sources, Shearing interferometers, Beam analyzers

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