Zhaoxiang Chu
Manager at Shanghai Micro Electronics Equipment Co Ltd
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 10 March 2010 Paper
Proceedings Volume 7640, 764035 (2010) https://doi.org/10.1117/12.848429
KEYWORDS: Process modeling, Wavefronts, Image quality, Lithography, Image processing, Critical dimension metrology, Mirrors, Performance modeling, Inspection, Mathematical modeling

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top