Zhe Chen
at Tianjin University
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 7 August 2015
Proc. SPIE. 9623, 2015 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
KEYWORDS: 3D metrology, 3D scanning, Projection systems, Beam expanders, Light emitting diodes, Optical arrays, Laser marking, Optical testing, Laser optics, Diffraction gratings

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