We present a novel scattering-type scanning near-field optical microscope (s-SNOM) operating in the terahertz (THz) wavelength. A home-made ultra-high sensitive detector named charge sensitive infrared phototransistor (CSIP, detection wavelength ~15 μm) is equipped for spontaneous thermal radiation detection (external illumination should be avoided). Thermal emission from room-temperature objects is collected by a cassegrain objective lens placed above the sample, and focused to a pinhole (d=250 μm) which is kept in liquid-helium (LHe) temperature(4.2 K). With the background radiation from environment efficiently blocked by the low-temperature pinhole, the detector is only sensitive to the THz radiation from a small spot (~λ) on sample surface (the confocal point). As a result, thermal radiation spontaneously emitted by object itself is measured with an excellent spatial resolution of ~14 μm (diffraction-limit). For overcoming the diffraction limit by detecting the near-field evanescent waves, this THz microscope is combined with a home-built atomic-force microscope (AFM). With sharp AFM tip (<100 nm) scattering the evanescent waves with an improved tip-modulation method, we successfully obtained thermal near-field images with a spatial resolution of ~100 nm, which is already less than 1% of the detection wavelength (15 μm). This THz s-SNOM should be a powerful tool for various material research down to the nanometer scale.