Dr. Zhenrong Jin
at GLOBALFOUNDRIES Inc
SPIE Involvement:
Author
Publications (3)

PROCEEDINGS ARTICLE | June 11, 2007
Proc. SPIE. 6600, Noise and Fluctuations in Circuits, Devices, and Materials
KEYWORDS: Transistors, Data modeling, Resistance, CMOS technology, Instrument modeling, Radon, Field effect transistors, Integrated modeling, Lithium, Thermal modeling

PROCEEDINGS ARTICLE | May 23, 2005
Proc. SPIE. 5844, Noise in Devices and Circuits III
KEYWORDS: Virtual colonoscopy, Resistors, Microelectronics, Temperature metrology, Electrochemical etching, Spectrum analysis, Transistors, Iterated function systems, Silicon, Instrument modeling

PROCEEDINGS ARTICLE | May 23, 2005
Proc. SPIE. 5844, Noise in Devices and Circuits III
KEYWORDS: Transistors, Oxides, Analog electronics, Temperature metrology, Resistance, Physics, Tolerancing, Signal detection, Ionizing radiation, Amplifiers

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