Dr. Zhenrong Jin
at GLOBALFOUNDRIES Inc
SPIE Involvement:
Author
Publications (3)

PROCEEDINGS ARTICLE | June 11, 2007
Proc. SPIE. 6600, Noise and Fluctuations in Circuits, Devices, and Materials
KEYWORDS: Lithium, Radon, Data modeling, Resistance, Integrated modeling, Transistors, Field effect transistors, CMOS technology, Thermal modeling, Instrument modeling

PROCEEDINGS ARTICLE | May 23, 2005
Proc. SPIE. 5844, Noise in Devices and Circuits III
KEYWORDS: Spectrum analysis, Silicon, Microelectronics, Transistors, Resistors, Iterated function systems, Electrochemical etching, Temperature metrology, Instrument modeling, Virtual colonoscopy

PROCEEDINGS ARTICLE | May 23, 2005
Proc. SPIE. 5844, Noise in Devices and Circuits III
KEYWORDS: Oxides, Ionizing radiation, Resistance, Physics, Amplifiers, Transistors, Analog electronics, Signal detection, Tolerancing, Temperature metrology

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