Amplitude-modulated continuous-wave laser scanners can realize 3D measurement with high longitudinal resolution. With installation of focusing optics in the laser scanning system, the high lateral resolution can be realized, which is enhanced by the focused beam spot size <100 um. However, the depth-of-focus of the focusing optics is generally several cm. The 3D data of the defocused objects are contaminated by aliases distributed by integer times of the half cycle of the periodical modulation. Aliasing is an impairment inherent in the amplitude-modulated continuous-wave scheme. We experimentally recovered the defocused data drastically by synthesizing those aliases. The ranging area can be elongated by at least ten times with such data processing compared with the depth of focus. Our results will contribute to highprecision industrial inspection for Industry 4.0.