Dr. Zhi Qiao
at Argonne National Lab
SPIE Involvement:
Author
Publications (6)

Proceedings Article | 3 October 2023 Presentation + Paper
Peifan Liu, Paresh Pradhan, Xianbo Shi, Deming Shu, Keshab Kauchha, Zhi Qiao, Kenji Tamasaku, Taito Osaka, Diling Zhu, Takahiro Sato, James MacArthur, XianRong Huang, Lahsen Assoufid, Marion White, Kwang-Je Kim, Yuri Shvyd'ko
Proceedings Volume 12695, 126950C (2023) https://doi.org/10.1117/12.2677194
KEYWORDS: Crystals, X-rays, Diamond, Reflection, Lenses, Mirrors, Laser crystals, X-ray characterization, Beryllium, Monochromators

Proceedings Article | 4 October 2022 Presentation + Paper
Proceedings Volume 12240, 122400H (2022) https://doi.org/10.1117/12.2635694
KEYWORDS: X-rays, Wavefront sensors, Metrology, Beryllium, Spatial resolution, Lenses, X-ray optics, Scattering, Speckle pattern, Coded apertures, Phase contrast, Neural networks, Phase imaging

Proceedings Article | 21 September 2021 Presentation + Paper
Sheikh Mashrafi, Ross Harder, Xianbo Shi, Deming Shu, Zhi Qiao, Max Wyman, Tim Mooney, Jayson Anton, Steven Kearney, Luca Rebuffi, Jun Qian, Bing Shi, Lahsen Assoufid
Proceedings Volume 11837, 118370E (2021) https://doi.org/10.1117/12.2594827
KEYWORDS: Mirrors, Hard x-rays, Machine learning, X-ray optics, Zoom lenses, Sensors, Sensor calibration, Prototyping, Optomechanical design, Optical design

Proceedings Article | 14 September 2020 Presentation + Paper
Sheikh Mashrafi, Ross Harder, Xianbo Shi, Deming Shu, Zhi Qiao, Max Wyman, Tim Mooney, Jayson Anton, Steven Kearney, Luca Rebuffi, Jun Qian, Bing Shi, Lahsen Assoufid
Proceedings Volume 11491, 114910T (2020) https://doi.org/10.1117/12.2567725
KEYWORDS: Mirrors, Hard x-rays, Machine learning, Control systems, Sensors, Profilometers, Feedback control, In situ metrology, Adaptive optics, Control systems design

Proceedings Article | 4 September 2020 Presentation + Paper
Proceedings Volume 11492, 114920O (2020) https://doi.org/10.1117/12.2569135
KEYWORDS: Speckle, Wavelet transforms, X-rays, Wavelets, Image processing, X-ray imaging, Wavefront sensors, Time metrology, Speckle pattern

Showing 5 of 6 publications
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