Zhifang Feng
at Beijing Univ of Chemical Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 24 August 2009
Proc. SPIE. 7381, International Symposium on Photoelectronic Detection and Imaging 2009: Material and Device Technology for Sensors
KEYWORDS: Refractive index, Finite-difference time-domain method, Metals, Composites, Dielectrics, Interfaces, Photonic crystals, Numerical simulations, Image quality, Negative refraction

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