It was considered to get interferometry data from microlens array and reconstruct initial image through it directly, while which used to be taken to calculate the phase difference to get the structure of objects in measurement technology. It broke through the depend of resolution improvement on the size of apertures, reducing the volume of image system vastly. Nevertheless, on account of the phase deficiency, this method could not show the details well enough to be generally used in measurement and control systems. Through support estimation of the target, with the feature extraction technology, the deconvolution function could be got, by which the sidelobe and pinniform structure in the “ditry” image caused by the lack of frequency could be eliminated, and phase retrieval was done. Simulation did the reconstruction experiment, yet had got relatively good detail presentations.