Zhihua Ban
at Huazhong University of Science and Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 14 December 2015 Paper
Proceedings Volume 9813, 98130E (2015) https://doi.org/10.1117/12.2204778
KEYWORDS: Pattern recognition, Machine vision, Detection and tracking algorithms, Neodymium, Distance measurement, Electroluminescent displays, Machine learning, Image processing, Computing systems, Visual process modeling

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