Zhihua Ban
at Huazhong University of Science and Technology
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | December 14, 2015
Proc. SPIE. 9813, MIPPR 2015: Pattern Recognition and Computer Vision
KEYWORDS: Visual process modeling, Detection and tracking algorithms, Image processing, Pattern recognition, Computing systems, Distance measurement, Machine vision, Machine learning, Neodymium, Electroluminescent displays

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