Dr. Zhihua Liu
at National Institute of Metrology
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 7 March 2019
Proc. SPIE. 11053, Tenth International Symposium on Precision Engineering Measurements and Instrumentation
KEYWORDS: Edge detection, Wavelet transforms, Cameras, Reliability, Image quality, Machine vision, Optical flow, Image enhancement, Motion measurement

Proceedings Article | 7 March 2019
Proc. SPIE. 11053, Tenth International Symposium on Precision Engineering Measurements and Instrumentation
KEYWORDS: Metrology, Calibration, Hough transforms, Laser interferometry, Machine vision, Standards development, Precision calibration

Proceedings Article | 7 March 2019
Proc. SPIE. 11053, Tenth International Symposium on Precision Engineering Measurements and Instrumentation
KEYWORDS: Metrology, Aerospace engineering, Sensors, Calibration, Amplifiers, Data acquisition, Signal processing, Mining, Error control coding, Sensor calibration

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