Prof. Zhiming Wu Profile

Prof. Zhiming Wu

at Univ of Electronic Science and Technology of China

SPIE Involvement:

Author

Publications (28)

Proceedings Article | 6 November 2023 Paper

Facile fabrication of quantum junction photodetectors based on PbSe Quantum Dots

Ruixue Lv, Zhiming Wu, Tao Tuo, Jun Wang

Proceedings Volume 12921, 1292104 (2023) https://doi.org/10.1117/12.2687361

KEYWORDS: Photodetectors, Lead, Quantum devices, Quantum dots, Fabrication, Excitons, Silicon, Quantum processes, Dark current, Photocurrent

Read Abstract +

Proceedings Article | 15 February 2022 Paper

Ultra-high phase transition amplitude of Fe-doped high-performance VO2 films manufactured by DC-magnetron sputtering for modulation application

Zihao Xiang, Zhiming Wu, Yuanlin Shi, Xiang Dong, Chunyu Li, Xuanru Chen, Jun Wang, Yadong Jiang

Proceedings Volume 12166, 121662I (2022) https://doi.org/10.1117/12.2615477

KEYWORDS: Iron, Doping, Vanadium, Sputter deposition, Crystals, Modulation, Manufacturing

Read Abstract +

Proceedings Article | 5 November 2020 Paper

Colloidal quantum dot-silicon photodetector based on TCAD simulation

Yuanlin Shi, Zhiming Wu, Jun Gou, Xiang Dong, Jun Wang, Yadong Jiang

Proceedings Volume 11567, 115670Z (2020) https://doi.org/10.1117/12.2576295

KEYWORDS: Doping, Silicon, Photodetectors, Sensors, External quantum efficiency, Quantum dots, Resistance, TCAD, Optoelectronic devices

Read Abstract +

Proceedings Article | 8 February 2019 Paper

Research on image stitching technology for focal plane array terahertz imaging

Peng Liu, Jiayue Han, Fulan Tian, Zhiming Wu, Jun Wang

Proceedings Volume 10843, 108430Z (2019) https://doi.org/10.1117/12.2506362

KEYWORDS: Image enhancement, Image processing, Nonlinear filtering, Image filtering, Terahertz radiation, Millimeter wave imaging, Imaging arrays, Imaging systems, Diffraction

Read Abstract +

Proceedings Article | 25 October 2016 Paper

THz transmittance and electrical properties of silicon doped vanadium dioxide films tuning by annealing temperature

Xuefei Wu, Zhiming Wu, Chunhui Ji, Zehua Huang, Jun Gou, Jun Wang, Yadong Jiang

Proceedings Volume 9686, 968603 (2016) https://doi.org/10.1117/12.2242776

KEYWORDS: Vanadium, Annealing, Terahertz radiation, Transmittance, Silicon, Silicon films, Crystals, Phase shift keying, Modulation, Resistance

Read Abstract +

Proceedings Article | 25 October 2016 Paper

Effects of annealing time on the application of vanadium dioxide films in smart windows

Chunhui Ji, Zhiming Wu, Xuefei Wu, Haoqian Feng, Xueting Ma, Yadong Jiang

Proceedings Volume 9686, 968612 (2016) https://doi.org/10.1117/12.2242821

KEYWORDS: Annealing, Vanadium, Transmittance, Modulation, Sputter deposition, Resistance, Thin films, Phase shift keying, Technetium, Optical properties

Read Abstract +

Proceedings Article | 25 October 2016 Paper

Detection of terahertz radiation using improved uncooled focal plane array detector

Xing Zheng, Zhiming Wu, Jun Gou, ZhiQing Liang, Yadong Jiang

Proceedings Volume 9686, 96861J (2016) https://doi.org/10.1117/12.2242405

KEYWORDS: Terahertz radiation, Absorption, Sensors, Staring arrays, Microbolometers, Imaging systems, Reactive ion etching, Sputter deposition, Thin films, Millimeter wave sensors

Read Abstract +

Proceedings Article | 25 October 2016 Paper

Fabrication and infrared absorption of tellurium doped silicon via femtosecond laser irradiation

Lingyan Du, Zhiming Wu, Fei Tang, Rui Li, Yadong Jiang

Proceedings Volume 9686, 96860Y (2016) https://doi.org/10.1117/12.2242176

KEYWORDS: Absorption, Infrared radiation, Tellurium, Silicon, Femtosecond phenomena, Semiconductor lasers, Silicon films, Thin films, Selenium, Scanning electron microscopy

Read Abstract +

Proceedings Article | 2 September 2014 Paper

Effects of pulse frequency on the microstructure, composition and optical properties of pulsed dc reactively sputtered vanadium oxide thin films

Xiang Dong, Zhiming Wu, Yadong Jiang, Xiangdong Xu, He Yu, Deen Gu, Tao Wang

Proceedings Volume 9284, 928414 (2014) https://doi.org/10.1117/12.2067762

KEYWORDS: Vanadium, Sputter deposition, Thin films, Refractive index, Optical properties, Absorption, Oxides, Transmittance, Plasma, Power supplies

Read Abstract +

Proceedings Article | 23 December 2013 Paper

Effect of duty cycle on the electrical and optical properties of VOx film deposited by pulsed reactive magnetron sputtering

Xiang Dong, Zhiming Wu, Xiangdong Xu, Xiongbang Wei, Yadong Jiang

Proceedings Volume 9043, 90430P (2013) https://doi.org/10.1117/12.2035356

KEYWORDS: Sputter deposition, Vanadium, Thin films, Oxides, Plasma, Crystals, Absorption, Temperature metrology, Oxygen, Refractive index

Read Abstract +

Proceedings Article | 15 October 2012 Paper

Design of the ramp generator for UIRFPA

Baobin Liao, Longcheng Que, Qiao Jiang, Wei He, Yun Zhou, Jian Lv, Zhiming Wu

Proceedings Volume 8419, 841925 (2012) https://doi.org/10.1117/12.973723

KEYWORDS: Infrared radiation, Capacitors, Infrared imaging, Switches, Thermography, Mirrors, Digital signal processing, Amplifiers, Staring arrays, Readout integrated circuits

Read Abstract +

Proceedings Article | 29 October 2010 Paper

Electrical and optical properties of amorphous vanadium oxide thin films deposited by DC magnetron sputtering

Zhenfei Luo, Zhiming Wu, Mingjun Du, Xiangdong Xu, Junsheng Yu, Tao Wang, Yadong Jiang

Proceedings Volume 7658, 765809 (2010) https://doi.org/10.1117/12.865957

KEYWORDS: Thin films, Temperature metrology, Vanadium, Scanning electron microscopy, Sputter deposition, Oxides, Optical properties, Transmittance, Resistance, Crystals

Read Abstract +

Proceedings Article | 22 October 2010 Paper

Design of SOPC-based infrared image enhancement system

Yanzhao Lei, Zhiming Wu, Ziji Liu, Jie Zhang, Tingting Wang, Ran Wang

Proceedings Volume 7658, 76585G (2010) https://doi.org/10.1117/12.866109

KEYWORDS: Thermography, Infrared imaging, Infrared radiation, Image enhancement, Image processing, Imaging systems, Nonuniformity corrections, Signal processing, Infrared detectors, Field programmable gate arrays

Read Abstract +

Proceedings Article | 22 October 2010 Paper

Study on the dependence of properties of TiOx heat sensitive films on deposit oxygen flow rate

Jing Jiang, Zhiming Wu, Yonglong Qiu, He Yu, Yadong Jiang

Proceedings Volume 7658, 76583J (2010) https://doi.org/10.1117/12.865557

KEYWORDS: Oxygen, Titanium, Oxides, Resistance, Sputter deposition, Transmittance, Thin films, Argon, Temperature metrology, Thin film devices

Read Abstract +

Proceedings Article | 22 October 2010 Paper

Systematical investigations of annealing effects on electrical properties and thermal sensitivity characteristics of TiO2-δ thin films by DC reactive magnetron sputtering

Yonglong Qiu, Zhiming Wu, Yongfeng Ju, Jing Jiang, Zhenfei Luo, MingJun Du

Proceedings Volume 7658, 76581R (2010) https://doi.org/10.1117/12.865942

KEYWORDS: Annealing, Thin films, Oxygen, Sputter deposition, Resistance, Titanium, Thin film devices, Oxides, Glasses, Titanium dioxide

Read Abstract +

Proceedings Article | 22 October 2010 Paper

Effect of temperature on the growth of vanadium oxide films deposited by DC reactive magnetron sputtering

Mingjun Du, Zhiming Wu, Zhenfei Luo, Xiangdong Xu, Junsheng Yu, Yadong Jiang

Proceedings Volume 7658, 76581Z (2010) https://doi.org/10.1117/12.865558

KEYWORDS: Vanadium, Oxides, Sputter deposition, FT-IR spectroscopy, Optics manufacturing, Optical testing, Optoelectronics, Optoelectronic devices, Image sensors, Sensors

Read Abstract +

Proceedings Article | 25 November 2009 Paper

Investigations on titanium oxide film as an alternative heat sensitive material

Jing Jiang, Zhiming Wu, Yadong Jiang, Tao Wang, He Yu

Proceedings Volume 7513, 751315 (2009) https://doi.org/10.1117/12.837590

KEYWORDS: Resistance, Oxygen, Titanium, Annealing, Oxides, Thin films, Sputter deposition, Transmittance, Microbolometers, Chemical species

Read Abstract +

Proceedings Article | 25 November 2009 Paper

Study on preparation and electrical properties of Mo-doped vanadium oxide thin films by organic sol-gel

Qianlin Zhang, Zhiming Wu, Yadong Jiang, Kang Zhao

Proceedings Volume 7513, 751314 (2009) https://doi.org/10.1117/12.837588

KEYWORDS: Vanadium, Thin films, Oxides, Doping, Resistance, Sol-gels, Molybdenum, Ions, Thin film devices, Glasses

Read Abstract +

Proceedings Article | 11 March 2008 Paper

Influence of substrate temperature on the morphology and thermal resistance of vanadium oxide thin films

Xiongbang Wei, Zhiming Wu, Tao Wang, Xiangdong Xu, Jingjing Tang, Yadong Jiang

Proceedings Volume 6984, 69842K (2008) https://doi.org/10.1117/12.792154

KEYWORDS: Thin films, Resistance, Temperature metrology, Vanadium, Sputter deposition, Oxides, Atomic force microscopy, Thin film deposition, Scattering, Thin film devices

Read Abstract +

Proceedings Article | 11 March 2008 Paper

Substrate effect on the growth and thermal electrical properties of vanadium oxide thin films

Xiongbang Wei, Zhiming Wu, Xiangdong Xu, Tao Wang, Jingjing Tang, Yadong Jiang

Proceedings Volume 6984, 69842J (2008) https://doi.org/10.1117/12.792139

KEYWORDS: Thin films, Glasses, Silicon, Vanadium, Resistance, Oxides, Crystals, Sputter deposition, Thin film deposition, Atomic force microscopy

Read Abstract +

Proceedings Article | 27 November 2007 Paper

Photovoltaic effect of different thickness vanadium oxide thin film

Xiongbang Wei, Zhiming Wu, Tao Wang, Shibin Li, Jingjing Tang, Yadong Jiang

Proceedings Volume 6723, 672342 (2007) https://doi.org/10.1117/12.783590

KEYWORDS: Thin films, Vanadium, Oxides, Photovoltaics, Thin film solar cells, Resistance, Solar energy, Silicon, Silicon films, Environmental sensing

Read Abstract +

Proceedings Article | 14 November 2007 Paper

Manufacturing and photoelectrical properties of P-doped a-Si:H thin films deposited by PECVD

Naiman Liao, Wei Li, Yadong Jiang, Yuejun Kuang, Kangcheng Qi, Zhiming Wu, Shibin Li

Proceedings Volume 6722, 672219 (2007) https://doi.org/10.1117/12.782992

KEYWORDS: Thin films, Thin film deposition, Plasma enhanced chemical vapor deposition, Refractive index, Atomic force microscopy, Thin film manufacturing, Plasma, Temperature metrology, Manufacturing, Thin film devices

Read Abstract +

Proceedings Article | 14 November 2007 Paper

Characterization of hydrogenated amorphous silicon thin films prepared by PECVD

Zhi-Ming Wu, Shi-Bin Li, Wei Li, Nai-Man Niao, Ya-Dong Jiang, Kui-Peng Zhu

Proceedings Volume 6722, 67222X (2007) https://doi.org/10.1117/12.783345

KEYWORDS: Plasma enhanced chemical vapor deposition, Amorphous silicon, Temperature metrology, Scanning electron microscopy, Silicon films, Thin films, Hydrogen, Atomic force microscopy, Silicon, Lithium

Read Abstract +

Proceedings Article | 14 November 2007 Paper

Effect of technical parameter on optical constants of amorphous silicon thin film

Shi-Bin Li, Zhi-Ming Wu, Kui-Peng Zhu, Ya-Dong Jiang, Wei Li, Nai-Man Niao

Proceedings Volume 6722, 67221U (2007) https://doi.org/10.1117/12.783030

KEYWORDS: Absorption, Thin films, Refractive index, Amorphous silicon, Plasma enhanced chemical vapor deposition, Hydrogen, Optical properties, Protactinium, Lithium, Thin film devices

Read Abstract +

Proceedings Article | 14 September 2001 Paper

Preparation and properties of self-assembled polyaniline films

Yadong Jiang, Dan Li, Dan Xie, Zhiming Wu, Bangchao Yang

Proceedings Volume 4414, (2001) https://doi.org/10.1117/12.440231

Read Abstract +

Proceedings Article | 20 July 1998 Paper

Layer-by-layer self-assembly of polyaniline/molybdenum trioxide nanocomposite ultrathin films by doping-induced deposition

Dan Li, Daben Yang, Yadong Jiang, Xinwu Deng, Zhiming Wu, Xiangdong Chen

Proceedings Volume 3324, (1998) https://doi.org/10.1117/12.316876

KEYWORDS: Nanocomposites, Polymers, Multilayers, Thin films, Molecular self-assembly, Absorption, Polymer thin films, Ellipsometry, Nanolithography, Thin film devices

Read Abstract +