Zhiwei Ben
at Soochow Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 25 November 2009
Proc. SPIE. 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology
KEYWORDS: Image processing algorithms and systems, Edge detection, Detection and tracking algorithms, Image segmentation, Image processing, Buildings, Computer vision technology, Color image processing, Machine vision, Image filtering

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