Zhiwen Lu
at Shanghai Gaojing Metal Detector Instrument Co Ltd
SPIE Involvement:
Author
Publications (4)

PROCEEDINGS ARTICLE | May 13, 2013
Proc. SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII
KEYWORDS: Detection and tracking algorithms, Sensors, Image segmentation, Glasses, Image processing, X-rays, Inspection, Image quality, X-ray imaging, Prototyping

PROCEEDINGS ARTICLE | August 2, 2004
Proc. SPIE. 5531, Interferometry XII: Techniques and Analysis
KEYWORDS: Phase shifting, Holograms, Holography, 3D image reconstruction, Digital holography, Image processing, Particles, Charge-coupled devices, Holographic interferometry, Phase shifts

PROCEEDINGS ARTICLE | August 2, 2004
Proc. SPIE. 5531, Interferometry XII: Techniques and Analysis
KEYWORDS: Phase shifting, Holograms, Holography, 3D image reconstruction, Digital holography, Fourier transforms, Charge-coupled devices, Reconstruction algorithms, Holographic interferometry, Phase shifts

PROCEEDINGS ARTICLE | November 4, 2003
Proc. SPIE. 5188, Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies
KEYWORDS: Holograms, Holography, Ferroelectric materials, 3D image reconstruction, Digital holography, Interferometry, Signal processing, Charge-coupled devices, Holographic interferometry, Phase shifts

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