Dr. Zhixiong Hu
at National Institute of Metrology
SPIE Involvement:
Publications (12)

Proceedings Article | 31 January 2020 Paper
Proc. SPIE. 11427, Second Target Recognition and Artificial Intelligence Summit Forum
KEYWORDS: Microscopy, 3D metrology, Image retrieval, Phase shifts

Proceedings Article | 18 December 2019 Paper
Proc. SPIE. 11338, AOPC 2019: Optical Sensing and Imaging Technology
KEYWORDS: Microscopes, Fringe analysis, Microscopy, Fourier transforms, Phase shifts

Proceedings Article | 17 May 2019 Paper
Proc. SPIE. 11170, 14th National Conference on Laser Technology and Optoelectronics (LTO 2019)
KEYWORDS: Confocal microscopy, Point spread functions, Imaging systems, Optical coherence tomography, Particles, Image resolution, 3D metrology, Confocal laser scanning microscopy, Surface finishing, 3D image processing

Proceedings Article | 18 January 2019 Paper
Proc. SPIE. 10839, 9th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment
KEYWORDS: Glucose, Tissues, Scattering, Calibration, Blood, Optical coherence tomography, Skin, Light scattering, Tissue optics, Natural surfaces

Proceedings Article | 19 October 2016 Paper
Proc. SPIE. 10155, Optical Measurement Technology and Instrumentation
KEYWORDS: Eye, Metrology, Ophthalmology, Optical coherence tomography, Eye models, Instrument modeling

Showing 5 of 12 publications
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