Dr. Zhong L. Wang
Regents' Professor at Georgia Institute of Technology
SPIE Involvement:
Author | Instructor
Publications (13)

Proceedings Article | 16 September 2011 Paper
Proc. SPIE. 8155, Infrared Sensors, Devices, and Applications; and Single Photon Imaging II
KEYWORDS: Photodetectors, Nanostructures, Sensors, Electrodes, Polymers, Ultraviolet radiation, Energy harvesting, Zinc oxide, Ultraviolet detectors, Nanowires

Proceedings Article | 2 June 2011 Paper
Proc. SPIE. 8019, Sensors, and Command, Control, Communications, and Intelligence (C3I) Technologies for Homeland Security and Homeland Defense X
KEYWORDS: Staring arrays, Signal to noise ratio, Infrared sensors, Nanostructures, Homeland security, Solar energy, Sensors, Ultraviolet radiation, Zinc oxide, Nanowires

Proceedings Article | 24 May 2011 Paper
Proc. SPIE. 8046, Unattended Ground, Sea, and Air Sensor Technologies and Applications XIII
KEYWORDS: Staring arrays, Signal to noise ratio, Nanostructures, Solar energy, Sensors, Ultraviolet radiation, Interference (communication), Zinc oxide, Unattended ground sensors, Nanowires

Proceedings Article | 11 March 2011 Paper
Proc. SPIE. 7940, Oxide-based Materials and Devices II
KEYWORDS: Gold, Nanostructures, Solar radiation models, Sensors, Ultraviolet radiation, Silicon, Zinc oxide, Ultraviolet detectors, Atmospheric modeling, Nanowires

Proceedings Article | 13 May 2010 Paper
Proc. SPIE. 7693, Unattended Ground, Sea, and Air Sensor Technologies and Applications XII
KEYWORDS: Staring arrays, Signal to noise ratio, Nanostructures, Sensors, Ultraviolet radiation, Interference (communication), Zinc oxide, Performance modeling, Unattended ground sensors, Nanowires

Showing 5 of 13 publications
Proceedings Volume Editor (1)

SPIE Conference Volume | 15 November 2002

Conference Committee Involvement (9)
Oxide-based Materials and Devices II
23 January 2011 | San Francisco, California, United States
Oxide-based Materials and Devices
24 January 2010 | San Francisco, California, United States
Micro- and Nanotechnology Sensors, Systems, and Applications
15 April 2009 | Orlando, Florida, United States
Zinc Oxide Materials and Devices IV
25 January 2009 | San Jose, California, United States
Nanosensing: Materials, Devices, and Systems III
11 September 2007 | Boston, MA, United States
Showing 5 of 9 Conference Committees
Course Instructor
SC495: Nano-scale Characterization and Metrology
Global nanotechnology initiatives are inspiring a lot of research in nanomaterials, which are the basis of future technologies. It is widely believed that those who control materials will control the future of science and technology. Characterization of nanophase materials raises challenges not only about analysis tools but also about fundamental methods. This course is about the advanced techniques used for characterization of nanomaterials. Details will be given about the structure analysis of nanoparticles, nanotubes and nanowires. The lecture mainly focuses on the determination of particle shape, crystallography of self-assembly, in situ shape transformation, and phase transformation. Characterization and property nanomeasurements of nanotubes and nanowires will also be illustrated.
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