Prof. Zhongsheng Lai
at East China Normal Univ
SPIE Involvement:
Author
Publications (19)

Proceedings Article | 8 December 2004 Paper
Wei Li, Yanling Shi, Jian Qing, Ling Jiang, Zheng Ren, Peisheng Xin, Ziqiang Zhu, Zongshen Lai
Proceedings Volume 5774, (2004) https://doi.org/10.1117/12.607790
KEYWORDS: Microelectromechanical systems, Switches, Phase shifts, Bridges, Silicon, Signal attenuation, Electrodes, Aluminum, Reliability, Gold

Proceedings Article | 8 December 2004 Paper
X. Bao, Yan Ding, Yu Chen, Ping Guo, Yan Shi, Lian Wang, Zong Lai
Proceedings Volume 5774, (2004) https://doi.org/10.1117/12.607898
KEYWORDS: Silicon, Silicon films, Glasses, Epoxies, Plasma enhanced chemical vapor deposition, Signal attenuation, Thin films, Crystals, Wafer bonding, Infrared radiation

Proceedings Article | 8 December 2004 Paper
Yun Liu, Yanling Shi, Xiao Feng, Yong Wang, Shaoqiang Chen, Xiaojin Li, Ziqiang Zhu, Zongshen Lai
Proceedings Volume 5774, (2004) https://doi.org/10.1117/12.607442
KEYWORDS: Silicon, Linear filtering, Picosecond phenomena, Metals, Lawrencium, Semiconducting wafers, Inductance, Microwave radiation, Integrated circuits, Circuit switching

Proceedings Article | 8 December 2004 Paper
Fangmin Guo, Xin Xu, Chengshi Li, Yuping Ge, Jianguo Yu, Peisheng Xin, Rongjin Zhu, Zongshen Lai, Ziqiang Zhu, Wei Lu
Proceedings Volume 5774, (2004) https://doi.org/10.1117/12.607393
KEYWORDS: Switches, Failure analysis, Microelectromechanical systems, Gold, Physics, Switching, Information operations, Modulators, Silicon, Solid state electronics

Proceedings Article | 8 December 2004 Paper
Xiao Feng, Shaohui Xu, Shaoqiang Chen, Jianzhong Zhu, Ziqiang Zhu, Zongshen Lai
Proceedings Volume 5774, (2004) https://doi.org/10.1117/12.607806
KEYWORDS: Picosecond phenomena, Copper, Silicon, Metals, Electroplating, Raman spectroscopy, Crystals, Scanning electron microscopy, Microcrystalline materials, Etching

Showing 5 of 19 publications
Proceedings Volume Editor (1)

Conference Committee Involvement (1)
Fifth International Conference on Thin Film Physics and Applications
31 May 2004 | Shanghai, China
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