Dr. Zhongwei Li
Associate Professor
SPIE Involvement:
Author
Area of Expertise:
Optical 3D measurement
Publications (13)

Proceedings Article | 24 November 2016
Proc. SPIE. 10023, Optical Metrology and Inspection for Industrial Applications IV
KEYWORDS: Detection and tracking algorithms, Target detection, Calibration, 3D acquisition, 3D metrology, Binary data, Evolutionary algorithms, Cameras, 3D image processing, Digital filtering

Proceedings Article | 13 November 2016
Proc. SPIE. 10023, Optical Metrology and Inspection for Industrial Applications IV
KEYWORDS: Field programmable gate arrays, Heterodyning, Phase shifts, Cameras, Image processing, Data modeling, Visual process modeling, Imaging systems, 3D modeling, Clocks

Proceedings Article | 13 November 2014
Proc. SPIE. 9276, Optical Metrology and Inspection for Industrial Applications III
KEYWORDS: 3D metrology, Cameras, Phase shifts, Projection systems, Speckle, Fringe analysis, Speckle pattern, 3D image processing, Motion measurement, 3D acquisition

Proceedings Article | 13 November 2014
Proc. SPIE. 9276, Optical Metrology and Inspection for Industrial Applications III
KEYWORDS: Calibration, Sensors, Clouds, Optical sensors, Inspection, Holography, System integration, Data modeling, 3D modeling, 3D metrology

Proceedings Article | 13 November 2014
Proc. SPIE. 9276, Optical Metrology and Inspection for Industrial Applications III
KEYWORDS: Clouds, Image registration, 3D scanning, 3D modeling, 3D metrology, Lithium, Sensors, 3D image processing, 3D acquisition, Structured light

Showing 5 of 13 publications
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