Dr. Zhongyu Wang
at Beijing Univ of Aeronautics and Astronautics
SPIE Involvement:
Conference Program Committee | Conference Chair | Author
Publications (38)

PROCEEDINGS ARTICLE | January 26, 2016
Proc. SPIE. 9903, Seventh International Symposium on Precision Mechanical Measurements
KEYWORDS: Lithium, LabVIEW, Opto mechatronics, Aerospace engineering, Calibration, Computing systems, Computer programming, Data processing, Transducers, Mechanical engineering

PROCEEDINGS ARTICLE | October 15, 2015
Proc. SPIE. 9671, AOPC 2015: Advances in Laser Technology and Applications
KEYWORDS: Microscopes, Metrology, Calibration, Image processing, Atomic force microscopy, Scanning electron microscopy, Data processing, Signal processing, Precision measurement, Charge-coupled devices

PROCEEDINGS ARTICLE | March 6, 2015
Proc. SPIE. 9446, Ninth International Symposium on Precision Engineering Measurement and Instrumentation
KEYWORDS: Statistical analysis, Visual process modeling, Data modeling, Error analysis, Time metrology, Distance measurement, Differential equations, Environmental sensing, Statistical modeling, Instrument modeling

PROCEEDINGS ARTICLE | October 10, 2013
Proc. SPIE. 8916, Sixth International Symposium on Precision Mechanical Measurements
KEYWORDS: Human-machine interfaces, LabVIEW, Mechanics, Sensors, Data storage, Databases, Resistance, Data acquisition, Data processing, Structural design

PROCEEDINGS ARTICLE | October 10, 2013
Proc. SPIE. 8916, Sixth International Symposium on Precision Mechanical Measurements
KEYWORDS: Mirrors, Beam splitters, Metrology, Digital signal processing, Interferometers, Calibration, Field programmable gate arrays, Signal processing, Precision measurement, Algorithm development

PROCEEDINGS ARTICLE | October 10, 2013
Proc. SPIE. 8916, Sixth International Symposium on Precision Mechanical Measurements
KEYWORDS: Lithium, Data modeling, Error analysis, Manufacturing, Clouds, Laser scanners, Optoelectronics, 3D metrology, Neural networks, Neurons

Showing 5 of 38 publications
Conference Committee Involvement (8)
Fourth International Seminar on Modern Cutting and Measurement Engineering
10 December 2010 | Beijing, China
Fourth International Seminar on Modern Cutting and Measurement Engineering
10 December 2010 | Beijing, China
Seventh International Symposium on Instrumentation and Control Technology: Measurement Theory and Systems and Aeronautical Equipment
10 October 2008 | Beijing, China
Seventh International Symposium on Instrumentation and Control Technology: Optoelectronic Technology and Instruments, Control Theory and Automation, and Space Exploration
10 October 2008 | Beijing, China
Seventh International Symposium on Instrumentation and Control Technology: Sensors and Instruments, Computer Simulation, and Artificial Intelligence
10 October 2008 | Beijing, China
Showing 5 of 8 published special sections
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