Zhu Ruan
at Univ of Science and Technology of China
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | May 29, 2013
Proc. SPIE. 8729, Scanning Microscopies 2013: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences
KEYWORDS: Monochromatic aberrations, Scattering, Image processing, Particles, Fourier transforms, Scanning electron microscopy, Monte Carlo methods, Statistical modeling, Device simulation, Instrument modeling

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