Mr. Zicai Zhang Profile

Zicai Zhang

at Hebei Univ

SPIE Involvement:

Author

Publications (5)

Proceedings Article | 21 December 2013 Paper

Optical poperty of Eu-doped ZnO films

Honghong Yang, Xiaoyun Teng, Wei Yu, Zicai Zhang, Xiaowei Li

Proceedings Volume 9047, 90470E (2013) https://doi.org/10.1117/12.2036513

KEYWORDS: Zinc oxide, Energy transfer, Luminescence, Ions, Europium, Sputter deposition, Excitons, Energy efficiency, Thin films, Ultraviolet radiation

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Proceedings Article | 21 December 2013 Paper

Si surface texture by pyramid structure ZnO glass mask blank

Jin Wang, Huina Feng, Conghui Jin, Zicai Zhang, Weidong Lai, Wei Yu, Guangsheng Fu

Proceedings Volume 9047, 90470A (2013) https://doi.org/10.1117/12.2035408

KEYWORDS: Zinc oxide, Reflectivity, Silicon, Reactive ion etching, Glasses, Photoresist materials, Scanning electron microscopy, Protactinium, Etching, Photomasks

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Proceedings Article | 18 November 2008 Paper

Optical properties of p-type Al and N co-doped ZnO films

Li Zhang, Wei Yu, Zicai Zhang, Jinchuan Zhang, Guangsheng Fu

Proceedings Volume 7135, 71353P (2008) https://doi.org/10.1117/12.803313

KEYWORDS: Zinc oxide, Aluminum, Optical properties, Doping, Plasma, Sputter deposition, Luminescence, Excitons, Zinc, X-ray diffraction

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Proceedings Article | 18 November 2008 Paper

Optical properties of protocrystalline silicon/amorphous SiC multilayer films

Guangsheng Fu, Luo Ma, Wanbing Lu, Zicai Zhang, Wei Yu

Proceedings Volume 7135, 713540 (2008) https://doi.org/10.1117/12.803517

KEYWORDS: Silicon, Multilayers, Silicon carbide, Absorption, Optical properties, Solar cells, Amorphous silicon, Raman spectroscopy, Raman scattering, Atomic force microscopy

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Proceedings Article | 18 November 2008 Paper

Influence of annealing environment on the hydrogen related bonding structure in silicon nitride thin films containing silicon nanoparticles

Wenge Ding, Wenhao Qi, Wanbing Lu, Zicai Zhang, Wei Yu, Guangsheng Fu

Proceedings Volume 7135, 71353X (2008) https://doi.org/10.1117/12.803448

KEYWORDS: Annealing, Silicon, Absorption, Hydrogen, Silicon films, Nanoparticles, Chemical species, Thin films, FT-IR spectroscopy, Thermography

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