Dr. Zirong Zhai
at GE Global Research
SPIE Involvement:
Author
Publications (6)

PROCEEDINGS ARTICLE | May 19, 2016
Proc. SPIE. 9868, Dimensional Optical Metrology and Inspection for Practical Applications V
KEYWORDS: Signal to noise ratio, Optical filters, Metrology, Lithium, Light emitting diodes, Optical sensors, Polarization, Reflection, Speckle, Interferometers, Cameras, Sensors, Inspection, Reflectivity, Semiconductor lasers, 3D metrology, Projection systems, Neodymium, 3D vision, Structured light

PROCEEDINGS ARTICLE | May 28, 2014
Proc. SPIE. 9110, Dimensional Optical Metrology and Inspection for Practical Applications III
KEYWORDS: Polishing, Statistical analysis, Scattering, Sensors, Calibration, Light scattering, Laser scattering, Surface roughness, Prototyping, Surface finishing

PROCEEDINGS ARTICLE | November 20, 2012
Proc. SPIE. 8563, Optical Metrology and Inspection for Industrial Applications II
KEYWORDS: Confocal microscopy, Imaging systems, Calibration, Light scattering, Manufacturing, Laser scattering, Surface roughness, Colorimetry, Optical interferometry, Surface finishing

PROCEEDINGS ARTICLE | October 12, 2007
Proc. SPIE. 6702, Soft X-Ray Lasers and Applications VII
KEYWORDS: Cameras, Spectroscopy, Refraction, Streak cameras, Picosecond phenomena, X-ray lasers, Molybdenum, Grazing incidence, Samarium, Plasma

PROCEEDINGS ARTICLE | October 12, 2007
Proc. SPIE. 6702, Soft X-Ray Lasers and Applications VII
KEYWORDS: Mirrors, X-rays, Zinc, Infrared lasers, Laser ablation, Solids, Aluminum, X-ray lasers, Thomson scattering, Plasma

PROCEEDINGS ARTICLE | September 18, 2007
Proc. SPIE. 6703, Ultrafast X-Ray Sources and Detectors
KEYWORDS: Optical filters, Mirrors, X-rays, Streak cameras, Picosecond phenomena, X-ray lasers, Molybdenum, Grazing incidence, Spherical lenses, Signal detection

Showing 5 of 6 publications
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