Mr. Ziyad Elalamy
R& D Engineer at Institut Fresnel
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | February 25, 2004
Proc. SPIE. 5250, Advances in Optical Thin Films
KEYWORDS: Thin films, Refractive index, Prisms, Silica, Polarization, Silicon, Refraction, Sol-gels, Thin film deposition, Temperature metrology

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