Dr. Ziyue Zhao
at Changcheng Institute of Metrology & Measurement
SPIE Involvement:
Author
Publications (7)

Proceedings Article | 12 March 2020 Paper
Proc. SPIE. 11439, 2019 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
KEYWORDS: Edge detection, Spatial frequencies, Interferometers, Cameras, Image processing, Laser marking, Image acquisition, Gaussian filters, Distance measurement, Image filtering

Proceedings Article | 12 March 2020 Paper
Proc. SPIE. 11439, 2019 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
KEYWORDS: Metrology, Image segmentation, Scanners, Control systems, Clouds, Optical testing, Optoelectronics, Distance measurement, 3D metrology, Data centers

Proceedings Article | 18 December 2019 Paper
Proc. SPIE. 11334, AOPC 2019: Optoelectronic Devices and Integration; and Terahertz Technology and Applications
KEYWORDS: Cameras, Sensors, Calibration, Metals, Manufacturing, Optoelectronics, Mathematics, Measurement devices, Optimization (mathematics), Sensor calibration

Proceedings Article | 12 January 2018 Paper
Proc. SPIE. 10621, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
KEYWORDS: Mathematical modeling, Imaging systems, Cameras, Data storage, Digital cameras, Optoelectronics, Connectors, Image storage, Dynamical systems, Camera shutters

Proceedings Article | 8 October 2015 Paper
Proc. SPIE. 9677, AOPC 2015: Optical Test, Measurement, and Equipment
KEYWORDS: Mathematical modeling, Transmitters, Metrology, Sensors, Calibration, Manufacturing, Laser applications, Receivers, Position sensors, Data fusion

Showing 5 of 7 publications
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