Prof. Zuohuah Huang
at South China Normal Univ
SPIE Involvement:
Author
Publications (12)

SPIE Journal Paper | August 4, 2016
JBO Vol. 21 Issue 08
KEYWORDS: Speckle, Angiography, Modulation, Cameras, Particles, Biomedical optics, Blood circulation, Video, Imaging systems, Microfluidics

PROCEEDINGS ARTICLE | October 11, 2010
Proc. SPIE. 7656, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
KEYWORDS: Ellipsometry, Refractive index, Polarization, Computing systems, Wave plates, Control systems, Optical testing, Semiconductor lasers, Telecommunications, Commercial off the shelf technology

PROCEEDINGS ARTICLE | November 20, 2009
Proc. SPIE. 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
KEYWORDS: Ellipsometry, Optical properties, Reflection, Annealing, Numerical simulations, Computer simulations, Numerical analysis, Monte Carlo methods, Optimization (mathematics), Algorithms

PROCEEDINGS ARTICLE | January 17, 2008
Proc. SPIE. 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
KEYWORDS: Ellipsometry, Optical filters, Statistical analysis, Optical properties, Scattering, Glasses, Interfaces, Light scattering, Polarizers, Optical testing

PROCEEDINGS ARTICLE | May 19, 2006
Proc. SPIE. 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
KEYWORDS: Carbon, Light sources, Environmental monitoring, Particles, Sulfur, Cements, Photoacoustic spectroscopy, Signal detection, Atmospheric monitoring, Atmospheric particles

PROCEEDINGS ARTICLE | February 23, 2006
Proc. SPIE. 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
KEYWORDS: Refractive index, Glasses, Image processing, Image acquisition, Phase shift keying, Optical testing, CCD cameras, Data processing, Charge-coupled devices, Phase measurement

Showing 5 of 12 publications
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