Yu Bai
at Institute of Optics and Electronics CAS
SPIE Involvement:
Author
Publications (6)

PROCEEDINGS ARTICLE | October 28, 2016
Proc. SPIE. 9683, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies
KEYWORDS: Infrared detectors, Thermography, Infrared imaging, Mid-IR, Refractive index, Optical design, Image quality, Infrared radiation, Modulation transfer functions, Temperature metrology

PROCEEDINGS ARTICLE | September 27, 2016
Proc. SPIE. 9948, Novel Optical Systems Design and Optimization XIX
KEYWORDS: Lithography, Optical design, Silica, Ultraviolet radiation, Wavefronts, Lens design, Objectives, Aspheric lenses, Modulation transfer functions, Optics manufacturing

PROCEEDINGS ARTICLE | September 2, 2014
Proc. SPIE. 9280, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes
KEYWORDS: Thermography, Infrared imaging, Optical components, Mirrors, Optical design, Diffractive optical elements, Image quality, Infrared radiation, Modulation transfer functions, Temperature metrology

PROCEEDINGS ARTICLE | August 6, 2014
Proc. SPIE. 9281, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies
KEYWORDS: Staring arrays, Infrared detectors, Mid-IR, Diffraction, Optical design, Modulation, Imaging systems, Image quality, Modulation transfer functions, Temperature metrology

PROCEEDINGS ARTICLE | August 30, 2013
Proc. SPIE. 8910, International Symposium on Photoelectronic Detection and Imaging 2013: Imaging Spectrometer Technologies and Applications
KEYWORDS: Long wavelength infrared, Infrared imaging, Mirrors, Optical design, Imaging systems, Reflectivity, Distortion, Image quality, Infrared radiation, Modulation transfer functions

PROCEEDINGS ARTICLE | October 16, 2012
Proc. SPIE. 8416, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies
KEYWORDS: Long wavelength infrared, Thermography, Infrared imaging, Chromatic aberrations, Diffraction, Optical design, Diffractive optical elements, Imaging systems, Infrared radiation, Modulation transfer functions

Showing 5 of 6 publications
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