Dr. Caixia Chang
at Hebei Univ of Technology
SPIE Involvement:
Author
Publications (3)

SPIE Journal Paper | 17 February 2021
OE Vol. 60 Issue 02

Proceedings Article | 10 October 2020 Presentation + Paper
Proc. SPIE. 11552, Optical Metrology and Inspection for Industrial Applications VII
KEYWORDS: Infrared imaging, 3D acquisition, Reflection, Imaging systems, Complex systems, Reflectivity, Deflectometry, Data processing, 3D metrology, Light

Proceedings Article | 18 December 2019 Paper
Proc. SPIE. 11338, AOPC 2019: Optical Sensing and Imaging Technology
KEYWORDS: Infrared cameras, Mirrors, Fringe analysis, Cameras, Calibration, Glasses, Deflectometry, 3D metrology, Projection systems, Infrared radiation

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